Metrology and Inspection

Closed Loop Manufacturing

Coordinate Measuring Machine (CMM) specification and selection: Ensuring precise measurement in closed loop manufacturing.
CMM sensor technologies guidance: Advising on the latest sensor technologies to enhance measurement accuracy.
Market Analysis: Evaluating the market to identify the best CMM solutions.
Systems development and design: Creating tailored metrology systems to fit specific manufacturing needs.

Advising on the appropriate measurement and inspection technologies based on specific industry needs: Tailored recommendations to optimize closed loop manufacturing processes.
Evaluating existing technology stacks and recommending upgrades or replacements: Enhancing current systems for better efficiency.
Cost-benefit analyses of various metrology equipment and systems: Ensuring the best return on investment for metrology solutions.

Automated Optical Inspection specification and selection: Selecting systems for automated defect detection in closed loop manufacturing.
Fault and defect detection within complex surface guidance: Ensuring quality through advanced inspection techniques.
High-speed in-line Inspection specification and selection: Integrating high-speed inspection into production lines.
Market Analysis: Understanding market trends to choose the best inspection technologies.
Systems development and design: Customizing visual inspection systems for specific manufacturing requirements.

Industrial computed tomography (CT) specification and selection: Choosing CT systems for detailed internal inspections.
Fault and defect detection within complex parts guidance: Ensuring the integrity of complex components.
Metrology design: Developing CT-based metrology solutions.
Market Analysis: Evaluating CT technologies in the market.
Systems development and design: Designing CT systems for closed loop manufacturing.

Design and development of bespoke measurement and inspection setups: Creating unique solutions for specific manufacturing challenges.
Integration of metrology solutions into production lines: Ensuring seamless integration for continuous feedback and adjustment.
Automation of inspection processes specification and selection: Streamlining inspections to maintain quality in closed loop manufacturing.

Optical Microscope Applications specification and selection: Choosing microscopes for detailed surface analysis.
SEM / FIB applications specification and selection: Selecting scanning electron and focused ion beam microscopes for advanced analysis.
X-ray microscope applications specification and selection: Utilizing X-ray microscopes for internal structural analysis.